Continuity |
Current |
5mA to 1000mA Programmable
1mA |
Voltage |
1V to 30V Programmable to 1V |
High
Voltage DC |
Voltage |
25V to 100V Programmable 5V |
Current |
0.1uA to 4000uA |
High
Voltage AC (when fitted) |
Voltage |
25V to 50V RMS @ 50 Hz Programmable
to 5V |
Current |
1uA to 5000uA |
Typical
Test Performance |
Continuity |
Switching speed > 50000 points
per second
0.05s per established connection
0.05s shorts test per point |
Insulation and Hi-pot |
Programmable Ramp, Pre Dwell and
Dwell times.
Minimum 0.1s per point |
Measurements |
Continuity |
0.1次 to 100K次
Accuracy 0.5% +/- 0.1次 @ 1000mA
Resolution 0.1次 |
DC Insulation |
5K次 to 100M次 Accuracy 5% |
AC Hi-pot |
1uA to 5000uA Accuracy 5% |
Interface |
128 off 2 wire Test points
per board
Maximum 2048 test points per sub-rack,
maximum 512 sub-racks, 524288 points
Connection via high specification 64
way ‘DIN 41612’ type sockets
Connection on pins a1 to a32, c1 to
c32, interlock on front panel
|
Options |
Extended continuity range
up to 1M次
Increased continuity test current up
to 10A
Custom voltages up to 100KV
External Instruments and customised
electrical tests
Communication with other devices
Customised import facility for programme
creation
Capacitance and Inductance Measurement |
